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 DATA SHEET
MOS FIELD EFFECT TRANSISTOR
PA1757
SWITCHING N-CHANNEL POWER MOS FET INDUSTRIAL USE
Description
This product is Dual N-Channel MOS Field Effect Transistor designed for power management application of notebook computers, and Li-ion battery application.
8
Package Drawing (Unit : mm)
5 1 ; Source 1 2 ; Gate 1 7, 8 ; Drain 1 3 ; Source 2 4 ; Gate 2 5, 6 ; Drain 2
Features
* Dual MOS FET chips in small package * 2.5 V gate drive type and low on-resistance RDS(on)1 = 23 m (MAX.) (VGS = 4.5 V, ID = 3.5 A)
1.44
RDS(on)2 = 32 m (MAX.) (VGS = 2.5 V, ID = 3.5 A)
1.8 Max.
1 5.37 Max.
4
6.0 0.3 4.4
+0.10 -0.05
* Low Ciss
0.8
Ciss = 750 pF Typ.
0.05 Min.
* Small and surface mount package (Power SOP8)
0.15
* Built-in G-S protection diode
0.5 0.2 0.10
1.27 0.40
0.78 Max. 0.12 M
+0.10 -0.05
Ordering information
Part Number Package Power SOP8
PA1757G
Absolute Maximum Ratings (TA = 25 C)
Drain to source voltage Gate to source voltage Drain current (DC) Drain current (pulse)
Note1 Note2 Note2
VDSS VGSS ID(DC) ID(pulse) PT PT Tch Tstg
20 12.0 7.0 28 1.7 2.0 150 -55 to +150
2
V V A A W W C C
Drain
Total power dissipation (1 unit) Total power dissipation (2 unit) Channel temperature Storage temperature
Gate
Body Diode
Notes 1. PW 10 s, Duty Cycle 1 % 2. TA = 25 C, Mounted on ceramic substrate of 2000 mm x 1.1 mm
Gate Protection Diode
Source
The diode connected between the gate and source of the transistor serves as a protector against ESD. When this device actually used, an additional protection circuit is externally required if a voltage exceeding the rated voltage may be applied to this device.
The information in this document is subject to change without notice.
Document No. D12910EJ2V0DS00 (2nd edition) Date Published September 1998 NS CP (K) Printed in Japan
(c)
1998
PA1757
Electrical Characteristics (TA = 25 C)
Characteristics Drain to source on-state resistance Symbol RDS(on)1 RDS(on)2 Gate to source cutoff voltage Forward transfer admittance Drain leakage current Gate to source leakage current Input capacitance Output capacitance Reverse transfer capacitance Turn-on delay time Rise time Turn-off delay time Fall time Total gate charge Gate to source charge Gate to drain charge Body diode forward voltage VGS(off) | yfs | IDSS IGSS Ciss Coss Crss td(on) tr td(off) tf QG QGS QGD VF(S-D) ID = 7.0 A VDD = 16 V VGS = 4.0 V IF = 7.0 A, VGS = 0 V Test Conditions VGS = 4.5 V, ID = 3.5 A VGS = 2.5 V, ID = 3.5 A VDS = 10 V, ID = 1.0 mA VDS = 10 V, ID = 3.5 A VDS = 20 V, VGS = 0 V VGS = 12.0 V, VDS = 0 V VDS = 10 V VGS = 0 V f = 1 MHz ID = 3.5 A VGS(on) = 4.0 V VDD = 10 V RG = 10 750 420 140 57 206 593 815 13.0 2.6 5.3 0.75 0.5 5.0 MIN. TYP. 16.2 22 0.8 13 10 10 MAX. 23 32 1.5 Unit m m V S
A A
pF pF pF ns ns ns ns nC nC nC V
Test circuit 1 Switching time
D.U.T. RL PG. RG RG = 10 VDD
ID 90 % 90 % ID 0 10 % td(on) ton tr td(off) toff 10 % tf VGS
Test circuit 2 Gate charge
D.U.T. IG = 2 mA
VGS(on) 90 %
VGS
Wave Form
RL VDD
0
10 %
PG.
50
VGS 0 = 1 s Duty Cycle 1 %
ID
Wave Form
2
PA1757
Typical Characteristics (TA = 25 C)
TRANSIENT THERMAL RESISTANCE vs. PULSE WIDTH 1 000
rth(t) - Transient Thermal Resistance - C/W
100
10
1
0.1
0.01 0.001
Mounted on ceramic substrate of 2000mm 2 x 1.1mm Single Pulse , 1 unit
10
100
1m
10 m
100 m
1
10
100
1 000
PW - Pulse Width - S
RDS(on) - Drain to Source On-State Resistance - mW
FORWARD TRANSFER ADMITTANCE vs. DRAIN CURRENT
| yfs | - Forward Transfer Admittance - S
100
TA=-50C -25C
VDS=10V Pulsed
DRAIN TO SOURCE ON-STATE RESISTANCE vs. GATE TO SOURCE VOLTAGE 75 Pulsed
10
TA=25C 75C 150C
50
ID=3.5A 25
1
0.1
1
10
100
0
2
4
6
8
10
12
14
ID- Drain Current - A
RDS(on) - Drain to Source On-State Resistance - m
VGS - Gate to Source Voltage - V GATE TO SOURCE CUTOFF VOLTAGE vs. CHANNEL TEMPERATURE
DRAIN TO SOURCE ON-STATE RESISTANCE vs. DRAIN CURRENT
VGS(off) - Gate to Source Cutoff Voltage - V
60
Pulsed
1.0
VDS = 10 V ID = 1 mA
40 VGS=2.5V
0.5
20 VGS=4.5V 0 1 10 ID - Drain Current - A 100
0 - 50 0 50 100 150 Tch - Channel Temperature -C
3
PA1757
RDS(on) - Drain to Source On-State Resistance - m
DRAIN TO SOURCE ON-STATE RESISTANCE vs. CHANNEL TEMPERATURE
IF - Diode Forward Current - A
SOURCE TO DRAIN DIODE FORWARD VOLTAGE Pulsed
40 VGS=2.5V 30
100 VGS=2.5V 10 VGS=0
20
VGS=4.5V
1
10 ID= 3.5A - 50 0 50 100 150
0.1 0 0.5 1.0 1.5
0
Tch - Channel Temperature -C CAPACITANCE vs. DRAIN TO SOURCE VOLTAGE
VSD - Source to Drain Voltage - V
SWITCHING CHARACTERISTICS 1 000
td(on), tr, td(off), tf - Switching Time - ns
10000
Ciss, Coss, Crss - Capacitance - pF
VGS = 0 f = 1 MHz
tr
tf td(off) td(on)
1000 Ciss Coss 100 Crss
100
10
10 0.1
1
10
100
1 0.1
1
VDD =10V VGS(on) = 4V RG =10 10 100
VDS - Drain to Source Voltage - V
ID - Drain Current - A
REVERSE RECOVERY TIME vs. DRAIN CURRENT 1 000
trr - Reverse Recovery Time - ns VDS - Drain to Source Voltage - V
30
100
VDD=16V 10V 4V
VGS
6
20
4
10
10 VDS 0 4 8 12
2
1 0.1
1
10
100
0 16
IF - Diode Current - A
QG - Gate Charge - nC
4
VGS - Gate to Source Voltage - V
di/dt =100A/ s VGS = 0
DYNAMIC INPUT/OUTPUT CHARACTERISTICS 8 40 ID=7.0A
PA1757
DERATING FACTOR OF FORWARD BIAS SAFE OPERATING AREA
PT - Total Power Dissipation - W/package
TOTAL POWER DISSIPATION vs. AMBIENT TEMPERATURE 2.8 2.4 2.0 1.6 1.2 0.8 0.4 0 20 40 60 80 100 120 140 160 2 unit 1 unit Mounted on ceramic substrate of 2000mm 2 x 1.1mm
dT - Percentage of Rated Power - %
100 80 60 40 20
0
20
40
60
80
100 120 140 160
TA - Ambient Temperature - C
TA - Ambient Temperature - C DRAIN CURRENT vs. DRAIN TO SOURCE VOLTAGE Pulsed 25
ID - Drain Current - A
FORWARD BIAS SAFE OPERATING AREA 100
S(
d ite im 5V) . )L on =4
S
ID(pulse)
Mounted on ceramic substrate of 2000mm x 1.1mm21 unit
1 m s
ID - Drain Current - A
RD t VG (a
VGS=4.5V 20 15 10 5 2.5V
10
ID(DC)
10 10
m
s
0m
s
Po
1
we
rD
DC
iss ipa tio
n
Lim
0.1 0.1
TA = 25 C Single Pulse 1
ite
d
10
100
0
0.2
0.4
0.6
0.8
VDS - Drain to Source Voltage - V
VDS - Drain to Source Voltage - V
FORWARD TRANSFER CHARACTERISTICS 100 Pulsed
ID - Drain Current - A
10 TA=150C 125C 1 75C TA=25C -25C -50C 0.1 VDS=10V 0 1 2 3 4
VGS - Gate to Source Voltage - V
5
PA1757
[MEMO]
6
PA1757
[MEMO]
7
PA1757
No part of this document may be copied or reproduced in any form or by any means without the prior written consent of NEC Corporation. NEC Corporation assumes no responsibility for any errors which may appear in this document. NEC Corporation does not assume any liability for infringement of patents, copyrights or other intellectual property rights of third parties by or arising from use of a device described herein or any other liability arising from use of such device. No license, either express, implied or otherwise, is granted under any patents, copyrights or other intellectual property rights of NEC Corporation or others. While NEC Corporation has been making continuous effort to enhance the reliability of its semiconductor devices, the possibility of defects cannot be eliminated entirely. To minimize risks of damage or injury to persons or property arising from a defect in an NEC semiconductor device, customers must incorporate sufficient safety measures in its design, such as redundancy, fire-containment, and anti-failure features. NEC devices are classified into the following three quality grades: "Standard", "Special", and "Specific". The Specific quality grade applies only to devices developed based on a customer designated "quality assurance program" for a specific application. The recommended applications of a device depend on its quality grade, as indicated below. Customers must check the quality grade of each device before using it in a particular application. Standard: Computers, office equipment, communications equipment, test and measurement equipment, audio and visual equipment, home electronic appliances, machine tools, personal electronic equipment and industrial robots Special: Transportation equipment (automobiles, trains, ships, etc.), traffic control systems, anti-disaster systems, anti-crime systems, safety equipment and medical equipment (not specifically designed for life support) Specific: Aircrafts, aerospace equipment, submersible repeaters, nuclear reactor control systems, life support systems or medical equipment for life support, etc. The quality grade of NEC devices is "Standard" unless otherwise specified in NEC's Data Sheets or Data Books. If customers intend to use NEC devices for applications other than those specified for Standard quality grade, they should contact an NEC sales representative in advance. Anti-radioactive design is not implemented in this product.
M4 96. 5


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